Instrument Index

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Electron Microscopy Service (EMS)

Manufacturer Model # Instrument Name Location
JEOL JEM-ARM200CF Aberration Corrected Analytical Electron Microscope (TEM/STEM) Science and Engineering South, 104A
Kratos AXIS-165 X-ray Photon Spectroscopy Science and Engineering South, 109B
Omicron VT-SPM Scanning Probe Microscope Science and Engineering South, 109B
Veeco GEN II Oxide Molecular Beam Epitaxy Science and Engineering South, 109B
Renishaw inVia Reflex Raman Spectrometer Science and Engineering South, 116B
JEOL JEM-3010 Materials Science TEM Science and Engineering South, 116C
JEOL JEM-1220 Life Science TEM Medical Sciences Building, E-5H
JEOL JSM-6320F Field Emission SEM Medical Sciences Building, E-32F
Hitachi S-3000N Variable Pressure SEM Medical Sciences Building, E-5G
Gatan, Protochips, Nanofactory, Fischione: 636 & 652, Aduro & Poseidon, SPM, 2030 Special Holders for TEM Science and Engineering South, 116A
Prep EMS-E Materials Science Specimen Preparation Science and Engineering South, 116A
Prep EMS-W Life Science and SEM Specimen Preparation Medical Sciences Building, E-5B
UIC - Ultrafast Physics UEM Ultrafast Electron Microscope Science and Engineering South, 119